Scanning microscopies 2011 [electronic resource] : advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences ; 26-28 April 2011, Orlando, Florida, United States / Michael T. Postek [and others] editors ; sponsored and published by SPIE.

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library) Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences -- SPIE Digital Library - Conference Proceedings
Corporate Author:	SPIE (Society)
Other Authors:	Postek, Michael T.
Format:	Electronic eBook
Language:	English
Published:	Bellingham, Wash. : SPIE, ©2011.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 8036.
Subjects:	Scanning electron microscopes > Congresses. Scanning electron microscopes. Conference papers and proceedings.

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