Scanning microscopies 2011 [electronic resource] : advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences ; 26-28 April 2011, Orlando, Florida, United States / Michael T. Postek [and others] editors ; sponsored and published by SPIE.
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| Online Access: |
Full Text (via SPIE Digital Library) Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences -- SPIE Digital Library - Conference Proceedings |
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| Corporate Author: | |
| Other Authors: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Bellingham, Wash. :
SPIE,
©2011.
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 8036. |
| Subjects: |
MARC
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