EE Technical Review

EE Technical Review [electronic resource]

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Areas of research reported include: ultrafast gating of microchannel plate x-ray spectrometers, study of power MOS fast switching techniques, lightning vulnerability of nuclear explosive test systems at the Nevada Test Site, and a computer model of the MFTF-B neutral beam accel dc power supply.

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Bibliographic Details
Online Access: Online Access
Corporate Author: Lawrence Livermore National Laboratory (Researcher)
Format: Government Document Electronic eBook
Language:English
Published: Livermore, Calif : Oak Ridge, Tenn. : Lawrence Livermore National Laboratory ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, 1985.
Subjects:
Explosives.
Document Types.
Electronic Equipment.
Electrical Engineering.
Computerized Simulation.
Engineering.
Microanalysis.
Power Supplies.
Simulation.
Equipment.
Lightning Arresters.
Measuring Instruments.
Electrical Equipment.
Testing.
Electronic Circuits.
Switching Circuits.
Leading Abstract.
X-ray Spectrometers.
Abstracts.
Nuclear Explosives.
Research Programs.
Spectrometers.
Microelectronics.

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Call Number: E 1.99:ucrl-50025-85-1
E 1.99:ucrl-50025-85-1 Available

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