Scientific detection of fakery in art II [electronic resource] : 20-21 September 1999, Boston, Massachusetts / Duane R. Chartier, Walter McCrone, Richard J. Weiss, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Authors:	Society of Photo-Optical Instrumentation Engineers, SPIE Digital Library
Other Authors:	Chartier, Duane R., McCrone, Walter C., Weiss, Richard J. (Richard Jerome), 1923-
Format:	Electronic eBook
Language:	English
Published:	Bellingham, Wash. : The Society, ©2000.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3851.
Subjects:	Art > Forgeries > Congresses. Art > Expertising > Congresses. Art and science > Congresses. Art and science. Art > Expertising. Art > Forgeries. Conference papers and proceedings.

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Call Number:	N8790 .S353 2000
N8790 .S353 2000	Available