Scientific detection of fakery in art II [electronic resource] : 20-21 September 1999, Boston, Massachusetts / Duane R. Chartier, Walter McCrone, Richard J. Weiss, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

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Bibliographic Details
Online Access: Full Text (via SPIE Digital Library)
Corporate Authors: Society of Photo-Optical Instrumentation Engineers, SPIE Digital Library
Other Authors: Chartier, Duane R., McCrone, Walter C., Weiss, Richard J. (Richard Jerome), 1923-
Format: Electronic eBook
Language:English
Published: Bellingham, Wash. : The Society, ©2000.
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3851.
Subjects:

MARC

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