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|a Scientific detection of fakery in art II
|h [electronic resource] :
|b 20-21 September 1999, Boston, Massachusetts /
|c Duane R. Chartier, Walter McCrone, Richard J. Weiss, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
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|a Bellingham, Wash. :
|b The Society,
|c ©2000.
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|a 1 online resource (v, 82 pages) :
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|a Includes bibliographical references and index.
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|a SPIE Digital Library.
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|t Scientific detection of fakery in art II.
|d Bellingham, Wash. : The Society, ©2000
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