Reliability stress and failure rate data for electronic equipment.

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Bibliographic Details
Online Access: Search for the full-text version of this title in HathiTrust
Corporate Author: United States. Department of Defense
Format: Government Document Book
Language:English
Published: [Washington] : [For sale by the Superintendent of Documents, U.S. Govt. Print. Off], [1962-]
Series:Military handbook ; MIL-HDBK-217.
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Description
Item Description:Cover title.
Physical Description:1 volume (loose-leaf) : illustrations ; 26 cm.
Bibliography:Includes bibliography.