Periodic overload and transport spectrum fatigue crack growth tests of Ti62222STA and Al2024T3 sheet [microform] / Edward P. Phillips.
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Format: | Government Document Microfilm Book |
Language: | English |
Published: |
Hampton, Va. : [Springfield, Va.] :
National Aeronautics and Space Administration, Langley Research Center ; [National Technical Information Service, distributor],
[1999]
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Series: | NASA technical memorandum ;
208995. |
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Click here to view report onlineNorlin Library - Government Information - Microform
Call Number: |
NAS 1.15:208995
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NAS 1.15:208995 | Restricted Place a Hold |
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Call Number: |
NAS 1.15:208995
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NAS 1.15:208995 | Available |