Periodic overload and transport spectrum fatigue crack growth tests of Ti62222STA and Al2024T3 sheet [microform] / Edward P. Phillips.

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Main Author: Phillips, Edward P.
Corporate Author: Langley Research Center
Format: Government Document Microfilm Book
Language:English
Published: Hampton, Va. : [Springfield, Va.] : National Aeronautics and Space Administration, Langley Research Center ; [National Technical Information Service, distributor], [1999]
Series:NASA technical memorandum ; 208995.
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Norlin Library - Government Information - Microform

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Call Number: NAS 1.15:208995
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