Fatigue-life prediction methodology using small-crack theory [microform] / J.C. Newman, Jr. and E.P. Phillips, M.H. Swain.

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Bibliographic Details
Main Author:	Newman, J. C.
Corporate Author:	Langley Research Center
Other Authors:	Phillips, Edward P., Swain, M. H.
Format:	Government Document Microfilm Book
Language:	English
Published:	Hampton, Va. : [Springfield, Va.] : National Aeronautics and Space Administration, Langley Research Center ; [National Technical Information Service, distributor], [1997]
Series:	NASA technical memorandum ; 110307.
Subjects:	Crack closure. Fatigue life. Crack propagation. Plastic properties. Stress intensity factors. Models. Crack tips.

Norlin Library - Government Information - Microform

Holdings details from Norlin Library - Government Information - Microform
Call Number:	NAS 1.15:110307
NAS 1.15:110307	Restricted Place a Hold