Electrical characterization of a Mapham inverter using pulse testing techniques [microform] / E.D. Baumann and I.T. Myers and A.N. Hammound.

Saved in:
Bibliographic Details
Main Author: Baumann, E. D.
Corporate Author: United States. National Aeronautics and Space Administration
Other Authors: Myers, Ira T., Hammoud, Ahmad N.
Format: Government Document Microfilm Book
Language:English
Published: [Washington, DC] : [Springfield, Va.] : [National Aeronautics and Space Administration] ; [For sale by the National Technical Information Service], [1990]
Series:NASA technical memorandum ; 103254.
Subjects:

Norlin Library - Government Information - Microform

Holdings details from Norlin Library - Government Information - Microform
Call Number: NAS 1.15:103254
NAS 1.15:103254 Restricted Place a Hold