Interferogram analysis for optical testing / Daniel Malacara, Manuel Servn, Zacarias Malacara.
Updating their work to account for recent trends in the field, the authors (all of the Centro de Investigaciones de Optica, Mexico) present an introduction to and overview of optical testing interferometers, which are use for measuring wavefront deformations on small scales. They provide comparison...
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| Online Access: |
Full Text (via Taylor & Francis) |
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| Main Author: | |
| Other Authors: | , |
| Format: | eBook |
| Language: | English |
| Published: |
Boca Raton, FL :
Taylor & Francis,
2005.
|
| Edition: | 2nd ed. |
| Series: | Optical engineering (Marcel Dekker, Inc.) ;
v. 84. |
| Subjects: |
MARC
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| 100 | 1 | |a Malacara, Daniel, |d 1937- | |
| 245 | 1 | 0 | |a Interferogram analysis for optical testing / |c Daniel Malacara, Manuel Servn, Zacarias Malacara. |
| 250 | |a 2nd ed. | ||
| 260 | |a Boca Raton, FL : |b Taylor & Francis, |c 2005. | ||
| 300 | |a 1 online resource (xv, 550 pages) : |b illustrations. | ||
| 336 | |a text |b txt |2 rdacontent. | ||
| 337 | |a computer |b c |2 rdamedia. | ||
| 338 | |a online resource |b cr |2 rdacarrier. | ||
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| 490 | 1 | |a Optical engineering ; |v 84. | |
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a Front cover; Contents; 1. Review and Comparison of the Main Interferometric Systems; 2. Fourier Theory Review; 3. Digital Image Processing; 4. Fringe Contouring and Polynomial Fitting; 5. Periodic Signal Phase Detection and Algorithm Analysis; 6. Phase-Detection Algorithms; 7. Phase-Shifting Interferometry; 8. Spatial Linear and Circular Carrier Analysis; 9. Interferogram Analysis with Moiré Methods; 10. Interferogram Analysis without a Carrier; 11. Phase Unwrapping; 12. Wavefront Curvature Sensing; Index; Back cover. | |
| 520 | |a Updating their work to account for recent trends in the field, the authors (all of the Centro de Investigaciones de Optica, Mexico) present an introduction to and overview of optical testing interferometers, which are use for measuring wavefront deformations on small scales. They provide comparison of the main interferometric systems and review the. | ||
| 650 | 0 | |a Diffraction patterns |x Data processing. | |
| 650 | 0 | |a Interferometers. | |
| 650 | 0 | |a Interferometry. | |
| 650 | 0 | |a Optical measurements. | |
| 650 | 7 | |a Diffraction patterns |x Data processing. |2 fast |0 (OCoLC)fst00893522. | |
| 650 | 7 | |a Interferometers. |2 fast |0 (OCoLC)fst00976233. | |
| 650 | 7 | |a Interferometry. |2 fast |0 (OCoLC)fst00976235. | |
| 650 | 7 | |a Optical measurements. |2 fast |0 (OCoLC)fst01046776. | |
| 700 | 1 | |a Malacara, Zacarias, |d 1948- | |
| 700 | 1 | |a Servn, Manuel. | |
| 776 | 0 | 8 | |i Print version: |a Malacara, Daniel, 1937- |t Interferogram analysis for optical testing. |b 2nd ed. |d Boca Raton, FL : Taylor & Francis, 2005 |z 1574446827 |z 9781574446821 |w (DLC) 2004056966 |w (OCoLC)56876382. |
| 830 | 0 | |a Optical engineering (Marcel Dekker, Inc.) ; |v v. 84. | |
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