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A computer program for analysis of data from microelectronic test structures / by Mattis, Richard L.
Published 1982Other Authors:Call Number: Loading…Online Access
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2
Release notes for STAT2 version 1.31 : an addendum to NBS Special Publication 400-75 / by Mattis, Richard L.
Published 1983Other Authors: “…Mattis, Richard L.…”
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3
Release notes for STAT2 version 1.7 : an addendum to NBS Special Publication 400-75 / by Mattis, Richard L.
Published 1986Other Authors: “…Mattis, Richard L.…”
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4
A FORTRAN program for analysis of data from microelectronic test structures / by Mattis, Richard L.
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A FORTRAN program for analysis of data from microelectronic test structures by Mattis, Richard L.
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6
Semiconductor measurement technology : BASIC program for calculating dopant density profiles from capacitance-voltage data / by Mattis, Richard L., Buehler, Martin G.
Published 1975Call Number: Loading…Search for the full-text version of this title in HathiTrust
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7
Carrier lifetime measurement by the photoconductive decay method / by Mattis, Richard L., Baroody, A. James, Jr
Published 1972Call Number: Loading…Search for the full-text version of this title in HathiTrust
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8
Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2 by Marshall, J. C. (Janet C.)
Published 1992Other Authors: “…Mattis, Richard L.…”
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9
Release notes for STAT2 version 2.00A : an addendum to NBS Special Publication 400-75 / by Ellenwood, C. H.
Published 1986Other Authors:Call Number: Loading…Online Access
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10
Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2 / by Marshall, J. C. (Janet C.)
Published 1992Other Authors:Call Number: Loading…Online Access
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11
Design considerations for the cross-bridge sheet resistor / by Carver, G. P.
Published 1982Other Authors:Call Number: Loading…Online Access
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12
Microelectronic test patterns NBS-12 and NBS-24 / by Carver, G. P.
Published 1981Other Authors:Call Number: Loading…Online Access
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