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  1. 1
    Characterization of high Ge content SiGe heterostructures and graded alloy layers using spectroscopic ellipsometry

    Characterization of high Ge content SiGe heterostructures and graded alloy layers using spectroscopic ellipsometry by Heyd, A. R.

    Published 1995
    Government Document Microfilm Book
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  2. 2
    Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry

    Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry

    Published 1996
    Other Authors: “…Heyd, A. R.…”
    Government Document Microfilm Book
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