Showing 1 - 4 results of 4 for search 'Christou, A.', query time: 0.02s Refine Results
  1. 1
    Automated scanning low-energy electron probe (ASLEEP) for semiconductor wafer diagnostics /

    Automated scanning low-energy electron probe (ASLEEP) for semiconductor wafer diagnostics / by Christou, A.

    Published 1978
    Search for the full-text version of this title in HathiTrust
    Government Document Book
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  2. 2
    Semiconductor Device Reliability /

    Semiconductor Device Reliability / by Christou, A.

    Published 1989
    Full Text (via Springer)
    eBook
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  3. 3
    Electromigration and electronic device degradation /

    Electromigration and electronic device degradation /

    Published 1994
    Other Authors: “…Christou, A.…”
    Book
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  4. 4
    Reliability of gallium arsenide MMICs /

    Reliability of gallium arsenide MMICs /

    Published 1992
    Other Authors: “…Christou, A.…”
    Book
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