| Call Number (LC) | Title | Results |
|---|---|---|
| TK7874 .I328 1999 | VLSI : systems on a chip : IFIP TC10 WG10.5 Tenth International Conference on Very Large Scale Integration (VLSI'99), December 1-4, 1999, Lisboa, Portugal / | 1 |
| TK7874 .I328 1999eb | VLSI systems on a chip : IFIP TC10 WG 10.5 Tenth International Conference on Very Large Scale Integration (VLSI'99), December 1-4, 1999, Lisboa, Portugal / | 1 |
| TK7874 .I328 2001 | SOC design methodologies : IFIP TC10/WG10.5 Eleventh International Conference on Very Large Scale Integration of Systems-on-Chip (VLSI-SOC'01), December 3-5, 2001, Montpellier, France / | 1 |
| TK7874 .I3282 1994eb | Logic and architecture synthesis : state-of-the-art and novel approaches : IFIP Workshop on Logic and Architecture Synthesis, 1994 / | 2 |
| TK7874 .I3283 1989 | Formal VLSI specification and synthesis : proceedings of the IFIP WG 10.2/WG 10.5 International Workshop on Applied Formal Methods for Correct VLSI Design / | 1 |
| TK7874 .I3283 1989a | Formal VLSI correctness verification : VLSI Design methods, II : proceedings of the IFIP WG 10.2/WG 10.5 International Workshop on Applied Formal Methods for Correct VLSI Design / | 1 |
| TK7874 .I33 1976eb | Hybrid microcircuit reliability data / | 1 |
| TK7874 .I35 2011 | VLSI-SoC advanced research for systems on chip ; 19th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2011, Hong Kong, China, October 3-5, 2011, revised selected papers / | 1 |
| TK7874 .I384 2013 | The Inverse Method : Parametric Verification of Real-time Unbedded Systems. | 1 |
| TK7874 .I437 2019 | Imaps 2018. | 1 |
| TK7874 .I445 1999 | In-line characterization, yield reliability, and failure analyses in microelectronic manufacturing : 19-21 May, 1999, Edinburgh, Scotland / | 1 |
| TK7874 .I445 2001 | In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June, 2001, Edinburgh, UK / | 1 |
| TK7874 .I446 2001 | In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June, 2001, Edinburgh, UK / | 1 |
| TK7874 .I46 1982 | The Impact of microelectronics technology / | 1 |
| TK7874.I46 P68 1988 | A tutorial introduction to occam 2 / | 1 |
| TK7874 .I463 1998 | In-line characterization techniques for performance and yield enhancement in microelectronic manufacturing II 23-24 September, 1998, Santa Clara, California / | 1 |
| TK7874 .I4633 1999 | In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing 19-21 May, 1999, Edinburgh, Scotland / | 1 |
| TK7874 .I4713 1998 | Integrated circuit manufacturability the art of process and design integration / | 1 |
| TK7874 .I4714 1995 | Integrated circuit metrology, inspection, and process control IX 20-22 February 1995, Santa Clara, California / | 1 |
| TK7874 .I47145 2003 |
Integrated passive component technology Integrated passive component technology / |
3 |
