| Call Number (LC) | Title | Results |
|---|---|---|
| TK7871.99.M44 M35 2012 | High-/mixed-voltage analog and RF circuit techniques for nanoscale CMOS | 1 |
| TK7871.99.M44 M36 1982 | MOS device and circuit design / | 1 |
| TK7871.99.M44 M37 2020 | CMOS analog and mixed-signal circuit design : practices and innovations / | 3 |
| TK7871.99.M44 M53 1993 | Statistical modeling for computer-aided design of MOS VLSI circuits / | 1 |
| TK7871.99.M44 N35 2016eb | Nano-CMOS and post-CMOS electronics. | 2 |
| TK7871.99.M44 N36 2005 | Nano-CMOS circuit and physical design / | 1 |
| TK7871.99.M44 N36 2005eb | Nano-CMOS circuit and physical design / | 2 |
| TK7871.99.M44 N362 2009 | Nano-CMOS design for manufacturabililty : robust circuit and physical design for sub-65 nm technology nodes / | 1 |
| TK7871.99.M44 N362 2009eb | Nano-CMOS design for manufacturability robust circuit and physical design for sub-65 nm technology nodes / | 1 |
| TK7871.99.M44 N365 2010eb | Nanoscale CMOS innovative materials, modeling, and characterization / | 1 |
| TK7871.99.M44 N4 2011 | CMOS analog integrated circuits high-speed and power-efficient design / | 2 |
| TK7871.99.M44 N52 1982 | MOS (metal oxide semiconductor) physics and technology / | 1 |
| TK7871.99.M44 O35 2008eb | Smart CMOS image sensors and applications | 1 |
| TK7871.99.M44 O35 2019 | Smart CMOS image sensors and applications / | 2 |
| TK7871.99.M44 O37 1999 |
High-performance system design : circuits and logic / High-performance system design circuits and logic / |
2 |
| TK7871.99.M44 O42 1999 | Ionizing radiation effects in MOS oxides / | 1 |
| TK7871.99.M44 O95 2002eb | Oxide reliability : a summary of silicon oxide wearout, breakdown, and reliability / | 1 |
| TK7871.99.M44 O95 2009 | Oxide and nitride semiconductors processing, properties and applications / | 1 |
| TK7871.99.M44 P36 2022 | Resistor-based temperature sensors in CMOS technology / | 1 |
| TK7871.99.M44 P38 2008 | CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test / | 1 |
