| Call Number (LC) | Title | Results |
|---|---|---|
| TK7871.99.M44 P38 2008eb | CMOS SRAM circuit design and parametric test in nano-scaled technologies process-aware SRAM design and test / | 1 |
| TK7871.99.M44 P56 2006 | Low-power CMOS circuits : technology, logic design and CAD tools / | 2 |
| TK7871.99.M44 P57 2011 | CMOS integrated switching power converters a structured design approach / | 1 |
| TK7871.99.M44 P63 2017 | Plasma etching for CMOS devices realization / | 1 |
| TK7871.99.M44 P69 2010 | Power/HVMOS devices compact modeling | 1 |
| TK7871.99.M44 R33 1996 | Low power design methodologies / | 1 |
| TK7871.99.M44 R35 1995 | Iddq testing for CMOS VLSI / | 1 |
| TK7871.99.M44 R37 2010 | Rare-earth implanted MOS devices for silicon photonics microstructural, electrical and optoelectronic properties / | 1 |
| TK7871.99.M44 R43 2022 | Recent advances in PMOS negative bias temperature instability : characterization and modeling of device architecture, material and process impact / | 1 |
| TK7871.99.M44 R455 2009 | Reliability wearout mechanisms in advanced CMOS technologies / | 1 |
| TK7871.99.M44 R455 2009eb | Reliability wearout mechanisms in advanced CMOS technologies | 1 |
| TK7871.99.M44 .R56 2014eb | Geometric models for rolling-shutter and push-broom sensors / | 1 |
| TK7871.99.M44 R668 2013 |
CMOS Sigma-Delta Converters : Practical Design Guide. CMOS sigma-delta converters : practical design guide / |
3 |
| TK7871.99.M44 R668 2013eb | CMOS sigma-delta converters practical design guide / | 1 |
| TK7871.99.M44 R668 2018 | Sigma-Delta Converters. | 1 |
| TK7871.99.M44 R67 2002eb | Systematic design of CMOS switched-current bandpass sigma-delta modulators for digital communication chips | 1 |
| TK7871.99.M44 S23 1998 | Defect oriented testing for CMOS analog and digital circuits / | 1 |
| TK7871.99.M44 S23 1998eb | Defect oriented testing for CMOS analog and digital circuits / | 1 |
| TK7871.99.M44 S23 2007 | Defect-oriented testing for nano-metric CMOS VLSI circuits / | 1 |
| TK7871.99.M44 S23 2007eb | Defect-oriented testing for nano-metric CMOS VLSI circuits | 1 |
