| Call Number (LC) | Title | Results |
|---|---|---|
| TA417.2 .Z69 2000 | Microwave non-destructive testing and evaluation / | 1 |
| TA417.23 |
Quantitative Microbeam Analysis. Scanning Probe Microscopy for Industrial Applications : Nanomechanical Characterization. Electron microscopy and analysis 2003 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003 / Specimen preparation for transmission electron microscopy of materials / X-ray optics and microanalysis, 1992 : proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK / Field emission scanning electron microscopy : new perspectives for materials characterization / Miniaturized testing of engineering materials / Surface microscopy with low energy electrons / Electron backscatter diffraction in materials science / |
10 |
| TA417.23 .A36 1992 | Acousto-optics and acoustic microscopy : presented at the Winter Annual Meeting of the American Society of Mechanical Engineers, Anaheim, California, November 8-13, 1992 / | 1 |
| TA417.23 .A38 1995 | Advances in acoustic microscopy / | 1 |
| TA417.23 .A38 1995eb | Advances in acoustic microscopy. | 1 |
| TA417.23 .A38 1996eb | Advances in acoustic microscopy. | 1 |
| TA417.23 .A39 2001 | Advances in materials problem solving with the electron microscope : symposium held November 30-December 3, 1999, Boston, Massachusetts, U.S.A. / | 1 |
| TA417.23 .A655 2004 | Applied scanning probe methods / | 2 |
| TA417.23 .A655 2006eb | Applied scanning probe methods II scanning probe microscopy techniques / | 1 |
| TA417.23 .A655 2007eb |
Applied scanning probe methods V : scanning probe microscopy techniques / Applied scanning probe methods VII : biomimetics and industrial applications / |
2 |
| TA417.23 .A655 2008 | Applied scanning probe methods X : biomimetics and industrial applications / | 1 |
| TA417.23 .A655 2008b | Applied scanning probe methods IX : characterization / | 2 |
| TA417.23 .A655 2008eb | Applied scanning probe methods X biomimetics and industrial applications / | 1 |
| TA417.23 .A655 2009b | Applied scanning probe methods XII characterization / | 1 |
| TA417.23 .A6552 2006 | Applied scanning probe methods II : scanning probe microscopy techniques / | 1 |
| TA417.23 .A6553 2006 | Applied scanning probe methods III : characterization / | 1 |
| TA417.23 .A6554 2005eb | Applied scanning probe methods III characterisation / | 1 |
| TA417.23 .A6554 2006 | Applied scanning probe methods IV : industrial applications / | 1 |
| TA417.23 .A6554 2006eb | Applied scanning probe methods IV industrial applications. | 1 |
| TA417.23 .A659 2007 | Applied scanning probe methods. | 1 |
