| Call Number (LC) | Title | Results |
|---|---|---|
| QH212.S3 S346 | Scanning probe microscopies. | 1 |
| QH212.S3 S346 2007 | Scanning microscopy for nanotechnology : techniques and applications / | 1 |
| QH212.S3 S346 2007eb | Scanning microscopy for nanotechnology techniques and applications / | 1 |
| QH212.S3 .S346 2010e | Scanning microscopy 2010 17-19 May 2010, Monterey, California, United States / | 1 |
| QH212.S3 S346 2011e | Scanning microscopies 2011 advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences ; 26-28 April 2011, Orlando, Florida, United States / | 1 |
| QH212.S3 S346 2012e | Scanning microscopies 2012 advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences ; 24-26 April 2012, Baltimore, Maryland, United States / | 1 |
| QH212.S3 S346 2013 |
Scanning microscopies 2014 : 16-18 September 2014, Monterey, California, United States / Scanning Microscopies 2013 : Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences ; 30 April-1 May 2013, Baltimore, Maryland, United States / |
2 |
| QH212.S3 S346 2015e | Scanning Microscopies 2015 : 29 September-1 October 2015, Monterey, California, United States / | 1 |
| QH212.S3 S347 1992 | Scanning microscopy instrumentation 22-23 July 1991, San Diego, California / | 1 |
| QH212.S3 S45 | SEM Sentinel SEM performance measurement system / | 1 |
| QH212.S3 S45 1989 |
SEM microcharacterization of semiconductors / SEM microcharacterization of semiconductors |
2 |
| QH212.S3 S556 2010 | New horizons of applied scanning electron microscopy | 1 |
| QH212.S3 S56 2004eb | Sir Charles Oatley and the scanning electron microscope | 1 |
| QH212.S3 S76 2008 | Principles and practice of variable pressure/environmental scanning electron microscopy (VP-ESEM) / | 1 |
| QH212.S3 S76 2008eb |
Principles and practice of variable pressure/environmental scanning electron microscopy (VP-ESEM) / Principles and practice of variable pressure/environmental scanning electron microscopy (VP-ESEM) |
2 |
| QH212.S3 W36 2023 | A practical guide to scanning electron microscopy in the biosciences / | 1 |
| QH212.S3 W44 |
Scanning electron microscopy Scanning electron microscopy / |
2 |
| QH212.S3 W55 1984 | Theory and practice of scanning optical microscopy / | 1 |
| QH212.S32 S27 1994eb QH212.S32S27 1991 | Scanning Force Microscopy : With Applications to Electric, Magnetic, and Atomic Forces. | 1 |
| QH212.S33 |
Scanning probe microscopy in industrial applications : nanomechanical characterization / Self-assembled water chains a scanning probe microscopy approach / Scanning ion conductance microscopy / Photons and Local Probes / Scanning probe microscopy for energy research / |
5 |
