| Call Number (LC) | Title | Results |
|---|---|---|
| QH212.S3 S29 2003 | Scanning electron microscopy and x-ray microanalysis / | 1 |
| QH212.S3 S3 1971 |
Scanning electron microscopy: systematic and evolutionary applications; proceedings of an international symposium held at the Dept. of Botany, University of Reading. Scanning electron microscopy : systematic and evolutionary applications; proceedings of an international symposium held at the Dept. of Botany, University of Reading / |
2 |
| QH212.S3 S32 1989 | Scanning imaging : ECO1, 21-23 September 1988, Hamburg, Federal Republic of Germany / | 1 |
| QH212.S3 S325 1992 | Scanning microscopy instrumentation : 22-23 July 1991, San Diego, California / | 1 |
| QH212.S3 S33 1988 | Scanning microscopy technologies and applications : 13-15 January 1988, Los Angeles, California / | 1 |
| QH212.S3 S34 1987 | Scanning imaging technology : 2-3 April 1987, The Hague, The Netherlands / | 1 |
| QH212.S3 S346 | Scanning probe microscopies. | 1 |
| QH212.S3 S346 2007 | Scanning microscopy for nanotechnology : techniques and applications / | 1 |
| QH212.S3 S346 2007eb | Scanning microscopy for nanotechnology techniques and applications / | 1 |
| QH212.S3 .S346 2010e | Scanning microscopy 2010 17-19 May 2010, Monterey, California, United States / | 1 |
| QH212.S3 S346 2011e | Scanning microscopies 2011 advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences ; 26-28 April 2011, Orlando, Florida, United States / | 1 |
| QH212.S3 S346 2012e | Scanning microscopies 2012 advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences ; 24-26 April 2012, Baltimore, Maryland, United States / | 1 |
| QH212.S3 S346 2013 |
Scanning Microscopies 2013 : Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences ; 30 April-1 May 2013, Baltimore, Maryland, United States / Scanning microscopies 2014 : 16-18 September 2014, Monterey, California, United States / |
2 |
| QH212.S3 S346 2015e | Scanning Microscopies 2015 : 29 September-1 October 2015, Monterey, California, United States / | 1 |
| QH212.S3 S347 1992 | Scanning microscopy instrumentation 22-23 July 1991, San Diego, California / | 1 |
| QH212.S3 S45 | SEM Sentinel SEM performance measurement system / | 1 |
| QH212.S3 S45 1989 |
SEM microcharacterization of semiconductors SEM microcharacterization of semiconductors / |
2 |
| QH212.S3 S556 2010 | New horizons of applied scanning electron microscopy | 1 |
| QH212.S3 S56 2004eb | Sir Charles Oatley and the scanning electron microscope | 1 |
| QH212.S3 S76 2008 | Principles and practice of variable pressure/environmental scanning electron microscopy (VP-ESEM) / | 1 |
