E 1.99:CONF-960848--10
|
Development and application of the lux gene for environmental bioremediation |
1 |
E 1.99: conf-960848--11
|
Hopping conduction in high electric fields three issues. |
1 |
E 1.99:CONF-960848--12
|
On controlling gravitational distortions in long synchrotron x-ray mirrors |
1 |
E 1.99:CONF-960848--13
|
Monochromators for small cross-section x-ray beams from high heat flux synchrotron sources |
1 |
E 1.99:CONF-960848--14
|
Upconversion processes in Yb-sensitized Tm ZBLAN. |
1 |
E 1.99:CONF-960848--15
|
Single-point diamond turning of lead indium phosphate glass |
1 |
E 1.99:CONF-960848--16
|
Open-path millimeter-wave spectroscopy in the 225--315 GHz range |
1 |
E 1.99:CONF-960848--17
|
Crystal diffraction lens telescope for focusing nuclear gamma rays |
1 |
E 1.99:CONF-960848--18
|
CdZnTe x-ray detector for 30 {endash} 100 keV energy |
1 |
E 1.99:CONF-960848--19
|
Experimental results with cryogenically cooled, thin, silicon crystal x-ray monochromators on high-heat-flux beamlines |
1 |
E 1.99:CONF-960848--20
|
Femtosecond excited-state absorption dynamics and optical limiting in fullerene solutions, sol-gel glasses, and thin films |
1 |
E 1.99:CONF-960848--21
|
Some practical aspects of undulator radiation properties |
1 |
E 1.99:CONF-960848--22
|
Bent crystal analyzer without grooves for inelastic scattering -- first experimental results |
1 |
E 1.99:CONF-960848--23
|
Microtomography with 3-D visualization |
1 |
E 1.99:CONF-960848--24
|
Significant improvements in long trace profiler measurement performance |
1 |
E 1.99:CONF-960848--25
|
Demonstration of a VOC in-situ fiber optic sensor for use with a penetrometer analysis system |
1 |
E 1.99:CONF-960848--26
|
Hypervelocity microparticle characterization |
1 |
E 1.99:CONF-960848--27
|
Two-dimensional pixel array image sensor for protein crystallography |
1 |
E 1.99:CONF-960848--28
|
Performance of the VUV high resolution and high flux beamline for chemical dynamics studies at the Advanced Light Source |
1 |
E 1.99: conf-960848--29
|
VSHOT a tool for characterizing large, imprecise reflectors. |
1 |