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E 1.99:ANL/MSD/CP-97586
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National Institute of Standards and Technology - Texas instruments industrial collaboratory testbed. |
1 |
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E 1.99:ANL/MSD/CP-97587
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In-situ transmission electron microscopy study of ion-irradiated copper comparison of the temperature dependence of cascade collapse in FCC- and BCC- metals. |
1 |
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E 1.99:ANL/MSD/CP-97608
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On the application of the weak-beam technique to the determination of the sizes of small point-defect clusters in ion-irradiated copper. |
1 |
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E 1.99:ANL/MSD/CP-97636
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In-situ observation of xenon nanocrystals in aluminum under electron and ion irradiation in transmission electron microscope. |
1 |
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E 1.99:ANL/MSD/CP-97683
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Vortex melting and the liquid state in YBa₂Cu₃O{sub x}. |
1 |
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E 1.99:anl/msd/cp-97758
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Understanding the role of defect production in radiation embrittlement of reactor pressure vessels. |
1 |
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E 1.99:anl/msd/cp-97759
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Correlating radiation exposure with embrittlement Comparative studies of electron- and neutron-irradiated pressure vessel alloys. |
1 |
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E 1.99:ANL/MSD/CP-97852
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Do cracks melt their way through solids? |
1 |
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E 1.99:ANL/MSD/CP-97853
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Magneto-optical studies of magnetization processes in high-Tc superconductors structure. |
1 |
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E 1.99:ANL/MSD/CP-98065
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Bias-voltage-controlled interlayer exchange coupling. |
1 |
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E 1.99:ANL/MSD/CP-98155
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Heavy-ion irradiation induced diamond formation in carbonaceous materials. |
1 |
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E 1.99:ANL/MSD/CP-98200
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Spring magnet films. |
1 |
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E 1.99:ANL/MSD/CP-98254
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c-axis twist Bi₂Sr₂CaCu₂O{sub 8+δ josephson junctions a new phase-sensitive test of order parameter symmetry. |
1 |
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E 1.99:ANL/MSD/CP-98293
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Microstructure and nonstoichiometry of barium strontium titanate thin films for dram applications. |
1 |
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E 1.99:ANL/MSD/CP-98330
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In situ examination of moving crack tips in ordered intermetallics. |
1 |
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E 1.99:ANL/MSD/CP-98511
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Observation of an elementary cuboctahedron of Xe nanocrystal in an Al matrix. |
1 |
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E 1.99:ANL/MSD/CP-98512
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Behavior of nanocrystalline Xe precipitates in Al under 1 MeV electron irradiation. |
1 |
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E 1.99:ANL/MSD/CP-98513
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HREM of general and twist grain boundaries. |
1 |
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E 1.99:ANL/MSD/CP-98514
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High angular resolution measurements of K shell x-ray emission created by electron channeling in the analytical electron microscope. |
1 |
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E 1.99:ANL/MSD/CP-98538
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In situ mass spectroscopy of recoiled ion studies of degradation processes in SrBi₂Ta₂O₉ thin films during hydrogen gas annealing. |
1 |
