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E 1.99: conf-931108--59
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The effects of amorphous layer regrowth on carbon activation in GaAs and InP |
1 |
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E 1.99:conf-931108--60
|
In-situ TEM crystallization of anorthite-glass films on α-Al₂O₃ |
1 |
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E 1.99: conf-931108--61
|
Defect-solute interactions near irradiation grain boundaries |
1 |
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E 1.99:conf-931108--62
|
Incoherent imaging by z-contrast stem Towards 1Å resolution. |
1 |
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E 1.99: conf-931108--63
|
Stability and precipitation kinetics in Si{sub 1-y}C{sub y}/Si and Si{sub 1-x-y}GeₓC{sub y}/Si heterostructures prepared by solid phase epitaxy |
1 |
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E 1.99: conf-931108--64
|
Kinetics of surface roughening and smoothing during ion sputtering |
1 |
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E 1.99: conf-931108--65
|
Dielectric and absorbate effects on the optical properties of phosphazenes |
1 |
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E 1.99: conf-931108--66
|
Microstructure and mechanical properties of nitrided molybdenum silicide coatings |
1 |
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E 1.99: conf-931108--67
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Ion-beam-driven amorphization of Ca₂La₈(SiO₄)₆O₂ single crystals |
1 |
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E 1.99:conf-931108--68
|
Structural characterization of semiconductor heterostructures by atomic resolution Z-contrast imaging at 300kV |
1 |
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E 1.99:conf-931108--69
|
Atomic-scale structure and chemistry of interfaces by Z-contrast imaging and electron energy loss spectroscopy in the STEM |
1 |
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E 1.99:conf-931108--70
|
Enhancement of oxidation resistance of silicon carbide by high-dose and multi-energy aluminum implantation |
1 |
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E 1.99:conf-931108--71
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The influence of an in-situ electric field on H⁺ and He⁺ implantation induced defects in silicon |
1 |
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E 1.99: conf-931108--72
|
Induced crystallization in CW laser-irradiated sol-gel deposited titania films |
1 |
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E 1.99:conf-931108--73
|
Characterization of the rare earth orthophosphates and Ce-doped LaPO₄ by X-ray Absorption Spectroscopy |
1 |
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E 1.99:conf-931108--74
|
Synthesis of (SiC)₃N₄ thin films by ion implantation |
1 |
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E 1.99:conf-931108--75
|
Study of nucleation and growth in Al-Zn alloys using TEM |
1 |
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E 1.99:conf-931108--76
|
Ion beam synthesis of IrSi₃ by 1-MeV Ir ion implantation into Si(111) |
1 |
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E 1.99: conf-931108--77
|
Determination of BPSG thin-film properties using IR reflection spectroscopy of product wafers |
1 |
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E 1.99: conf-931108--78
|
Characterization of thermally stable dye-doped polyimide based electrooptic materials |
1 |
